![]() ![]() If you would like to learn more about our best-in-class Laue diffraction tool, you may be interested in hearing some Insights into Laue Cameras from our MD Daniel Brau. If polychromatic x-rays derived from a synchrotron radiation spectrum are used, they generate a Laue diffraction pattern. Laue Single Crystal Orientation System: Compact | Motorised | Real-Time | Accurate These systems are available in both horizontal and vertical configurations, allowing users to scan along the axis of growth or to map the polycrystalline orientation of wafers. We offer a comprehensive crystal orientation system designed for real-time two-dimensional orientation mapping and mis-orientation measuring down to 0.05 degrees. This translates to less than 0.3 mm on-sample, making it ideal for extremely small crystals or small grain polycrystalline structures.Īs the sample is irradiated, a low-noise CCD or CMOS X-ray detector acquires as many Bragg reflections as possible to index Laue diffractions at specific RLPs. We use a high brilliant X-ray detector to generate an intense beam on an order of 9 – 29 keV focussed into a spot of no greater than 200 micrometres (μm). The relationship between spot intensity and RLPs is complex in Laue diffraction – but the pattern can provide extremely valuable insights into crystallographic orientation.Īt Photonics Science, we have developed a range of turnkey Laue diffraction systems using intense “white” beams with backscatter Laue detection. Laues discovery of the diffraction of x-rays in crystals, which Einstein called one of the most beautiful in physics, earned Laue the 1914 Nobel Prize in. ![]() This is to ensure that each spot can be indexed to a specific reciprocal lattice point (RLP) in the crystal. Your Laue diffraction system also needs to use polychromatic X-rays with a continuous spectrum of Bremsstrahlung, or “white”, radiation. Other detection geometries, like Laue transmission, are only suitable for thin crystals. You shine this beam through a detector onto your sample and – provided reflected signals satisfy Bragg’s law – the detector records the characteristic set of diffraction spots. The Laue technique uses a well collimated low energy X-ray beam to record the characteristic diffraction pattern of a stationary single crystal. Laue Diffraction Systems: What You Need to Know At Photonic Science, we provide a suite of high-throughput Laue diffraction systems that can assist with single-crystal orientation analysis and new innovative crystal growth such as geometrically-confined lateral crystal growth. This unique diffraction pattern is intrinsic of crystal orientation, which provided the basis for new methods of optical crystallography. In addition, the diffraction experiment measures the intensity of the reciprocal-lattice points, which are proportional to the square of the structure factors. This unique reflection geometry was first discovered by German physicist Max von Laue who shone an X-ray beam through a copper sulfate crystal in order to record its diffraction properties. Laue diffraction occurs when a polychromatic X-ray beam impinges on a crystal. Finally, Proto’s software package covers both collection and in-depth analysis, including support for all crystal systems and integration with the Crystallography Open Database (COD).News High-Throughput Laue Diffraction Systems When it comes to orienting the crystal for cutting or quickly scanning the crystal to identify reflections, manual or automated goniometers with chi, phi, and omega rotation are both available to best suit your experimental needs.įor more advanced applications, Proto can create custom saw-cutting adapters that can be utilized in the Laue-COS. The diffractometer can be configured with either a manual or motorized x,y stage for scanning across a crystal face or orientation mapping. Equipped with a Proto tungsten x-ray tube, the system delivers on quality and performance, as well as convenient warranty/support options. Flexibility and Safetyīecause it is housed in a large cabinet, the Laue-COS system enables the measurement of large parts and the incorporation of additional accessories while providing full radiation protection for users. An optional transmission camera is also available for weakly diffracting materials. Diffraction peaks will be observed in directions that the rays scattered from all lattice points. Binning capabilities help ensure quick collection times, making Laue orientation as efficient as possible. Equivalence of Braggs law and Laues condition. With low noise, a pixel size of 64 by 64 microns, and a 150-by-100-mm area, images are produced with incredible quality. The camera is sensitive to a broad range of energies (4-60 keV). The system features a back-reflection camera with high quantum efficiency that is made in house by Proto. Superior Image Quality for Accurate Single-Crystal Orientation ![]()
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